Highly efficient beamline and spectrometer for inelastic soft X-ray scattering at high resolution

Lai, C.H.; Fung, H.S.; Wu, W.B.; Huang, H.Y.; Fu, H.W.; Lin, S.W.; Huang, S.W.; Chiu, C.C.; Wang, D.J.; Huang, L.J.; Tseng, T.C.; Chung, S.C.; Chen, C.T.; Huang, D.J.

doi:10.1107/S1600577513030877

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 2
Illustration of the energy-compensation principle of grating dispersion applied to a RIXS measurement. Both gratings have an identical central groove density and the same distance to the sample. After passing through the entrance slit, X-rays of varied energy $[{\hbar\omega\,\pm\,\varepsilon}]$ are dispersed onto the sample and experience inelastic scattering. Scattered X-rays of identical energy loss ( $[\Delta_1]$ or $[\Delta_2]$ ) are dispersed and focused to the same point on the CCD.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 2| January 2014| Pages 325-332

doi:10.1107/S1600577513030877

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