Highly efficient beamline and spectrometer for inelastic soft X-ray scattering at high resolution

Lai, C.H.; Fung, H.S.; Wu, W.B.; Huang, H.Y.; Fu, H.W.; Lin, S.W.; Huang, S.W.; Chiu, C.C.; Wang, D.J.; Huang, L.J.; Tseng, T.C.; Chung, S.C.; Chen, C.T.; Huang, D.J.

doi:10.1107/S1600577513030877

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 3
Optical layout of the AGM–AGS beamline and spectrometer. The X-ray source is an elliptically polarized undulator. All distances have units of metres. See the text for the abbreviations of optical elements.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 2| January 2014| Pages 325-332

doi:10.1107/S1600577513030877

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