Figure 3
Characterization of the PicoSwitch. (a) Green: measured diffraction curve of the PicoSwitch. The data were recorded at the ID09B beamline at ESRF at an X-ray energy of 12 keV. Black: simulation of the unexcited structure; red: simulation for maximum layer expansion 2.25 ps after optical excitation; blue: simulation at t = 4.75 ps after optical excitation. At this delay all coherent sound waves have propagated into the substrate. (b) Ultrafast shift of the layer peak measured at the PXS at the University of Potsdam with an X-ray energy of 8.047 keV. The red curve shows a simulation of the coherent phonon dynamics. (c) Measurement (red bullets) and simulations (green and black solid lines) of the PicoSwitch. The measurement was performed at the Plasma X-ray Source (PXS) at the University of Potsdam. The simulation (green line) shows excellent agreement with the measured data. A larger contrast and switching efficiency is predicted for higher pump fluences (black line). The angle is the X-ray diffraction angle as defined in Fig. 2(a). |