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Figure 2
Three-dimensional models of the in situ synchrotron PLD chamber combined with the multipurpose heavy duty diffractometer installed at the NANO beamline, located at the synchrotron facility ANKA, Germany, where the linear detector and the two-dimensional detector Pilatus 100K could be used successively during the PLD growth. (a) The coplanar X-ray diffraction geometry used in the in situ PLD growth of (BST, x = 0.5) on MgO. (b) The two-dimensional detector positioned in the vertical plane with an angular range up to 70° corresponding to the non-coplanar diffraction geometry. (c) Three-dimensional model of the open in situ PLD chamber showing the hexapod as a sample manipulator used to align the sample with respect to the incident beam and to rotate the sample 360° around the surface normal. The sample surface is positioned vertically.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 2| January 2014| Pages 386-394
doi:10.1107/S1600577513034358
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