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Figure 3
Experimental XRR curves indicated by open circles and the fitting profiles obtained using the Bruker Leptos software package. The XRR curves were recorded after growth times of 2, 3, 4 and 5 min. The derived thicknesses from the fitting process indicate an average growth rate of 8.4 nm min−1.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 2| January 2014| Pages 386-394
doi:10.1107/S1600577513034358
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