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Figure 4
(a) Selected 2D-RSMs recorded during the PLD for deposition times of 0, 1, 7, 17 and 105 min. The corresponding film thicknesses for the deposition times 7, 17 and 105 min were derived by considering an average growth rate of 8.4 nm min−1 as derived from the XRR measurements. (b) Diffraction intensity profiles derived from the 2D-RSMs along the crystal truncation rod (CTR) showing the substrate peak of MgO and (BST, x = 0.5) peak 1 shifting continuously by increasing the film thickness recorded during the in situ synchrotron PLD investigation of the 002 reflection. The CTR profiles are shifted vertically for better clarity. (c) 2D-RSM of the asymmetric 113 reflection after the completion of the PLD growth at t = 105 min, showing two distinguishable peaks 1 and 2.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 2| January 2014| Pages 386-394
doi:10.1107/S1600577513034358
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