The power of in situ pulsed laser deposition synchrotron characterization for the detection of domain formation during growth of Ba0.5Sr0.5TiO3 on MgO

Bauer, S.; Lazarev, S.; Molinari, A.; Breitenstein, A.; Leufke, P.; Kruk, R.; Hahn, H.; Baumbach, T.

doi:10.1107/S1600577513034358

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Figure 5
Three-dimensional presentation of the variation of the diffraction intensity measured during the ablation of the (BST, x = 0.5) target by the Nd:YAG laser. The intensity profile is recorded by the linear detector Mythen 1K having 1280 channels. The sample is oriented at the Bragg angle for peak 2 and positioned in such a way that we cross the 2D-RSM along the yellow line going through the maximum intensity of peak 2 and partially through peak 1 as shown in the inset. Three main changes were detected at t₀ (17 min), t₁ (27 min) and t₂ (65 min).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 2| January 2014| Pages 386-394

doi:10.1107/S1600577513034358

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