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Figure 6
(a) Intensity profiles derived from the in situ RSMs along the angular direction recorded during the PLD growth of (BST, x = 0.5) on MgO. (b) Variation of the broadening of the angular intensity profiles expressed in FWHM with the deposition time. The inset indicates the direction of the cross section along the angular direction for deriving the intensity profiles. (c) Increase of the domain sizes with the deposition time derived for peaks 1 and 2. (d) AFM of the grown (BST, x = 0.5) on MgO sample for 105 min and after cooling the sample to room temperature, showing the presence of domain formation with a size distribution varying between 5 nm and 40 nm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 2| January 2014| Pages 386-394
doi:10.1107/S1600577513034358
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