Data processing software suite SITENNO for coherent X-ray diffraction imaging using the X-ray free-electron laser SACLA

Sekiguchi, Y.; Oroguchi, T.; Takayama, Y.; Nakasako, M.

doi:10.1107/S1600577514003439

Figure 10
Simulation examining the accuracy in estimating the direct-beam positions in diffraction patterns recorded by the MPCCD-Octal detector using equation (2)

. Diffraction patterns were calculated for 1000 models generated by randomly placing one or several circles of diameter 140 nm. Each diffraction pattern is converted to the pixel coordinate of the Octal detector by randomly shifting the direct-beam position within ±10 pixels. After scaling the maximum diffraction intensity among the 1000 diffraction patterns to the maximum photon number acceptable in the MPCCD pixel (2500 X-ray photons), the diffraction pattern was smeared by Poisson noise. (a) Representative nine diffraction patterns shown with the electron density models in the inset on the lower right. The scale bar corresponds to 300 nm. (b) Frequency distribution regarding the positional shifts of the estimated center-of-symmetry in 1000 diffraction patterns from the positions of the direct-beam given initially in the simulation. (c) Comparison of the frequency distribution on the center-of-symmetry positions of 1000 times analyses for patterns β (green colored bars) and α (red) in (a). (d) Schematic illustration of the geometrical relationship between the direct-beam positions in the MPCCD-Octal and the MPCCD-Dual detectors. The details are described in the text.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 3| May 2014| Pages 600-612

https://doi.org/10.1107/S1600577514003439

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