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Figure 3
Schematic illustration of the four processing steps for raw diffraction data by the TAMON, JIKOKU, KOHMOKU and ZOCHO subprograms of the SITENNO suite for a few thousands of diffraction patterns collected through a raster scan of the specimen disk (Fig. 1b[link]).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 3| May 2014| Pages 600-612
https://doi.org/10.1107/S1600577514003439
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