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Figure 5
Results from the data processing by the TAMON subprogram. (a) Diffraction patterns before (left) and after (right) background correction in the readout port, in which some pixels received X-ray photons exceeding the saturation limit. (b) Line profiles before (red circles) and after (green crosses) the correction between points A and B of the diffraction patterns in (a). (c) Histogram of the diffraction intensities of a user-defined ROI for 8738 diffraction patterns from cuboid-shaped copper oxide samples. Blue, pink and green histogram bars indicate no signal (820 diffraction patterns), below (3389) and above (4529) the given threshold intensity value, respectively.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 3| May 2014| Pages 600-612
https://doi.org/10.1107/S1600577514003439
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