Data processing software suite SITENNO for coherent X-ray diffraction imaging using the X-ray free-electron laser SACLA

Sekiguchi, Y.; Oroguchi, T.; Takayama, Y.; Nakasako, M.

doi:10.1107/S1600577514003439

Figure 6
Results from the data processing by the JIKOKU subprogram. (a) Determination of parameters in equation (1)

by fitting the diffraction pattern of a cuboid-shaped copper oxide particle simultaneously recorded in the MPCCD-Octal (outside the white dotted box in the left-hand panel) and the MPCCD-Dual (inside the white dotted box in the right-hand panel) detectors. The experimental diffraction patterns are shown with those calculated from the determined values of the parameters (Table 2

). The line profiles along positions A and B in the upper panels are shown in semi-log plots to emphasize the continuity in the borders between the experimental and theoretical data. The regions of theoretical prediction are indicated by the gray-colored background. (b) Distribution of 4529 diffraction patterns classified with respect to the diffraction intensity and C_sym scores. (c) Distribution of pixel positions assigned as center-of-symmetry searched using C_sym scores for diffraction patterns with the 500 highest intensities (indicated by an arrow) in (b) in the MPCCD-Octal detector (left) and the MPCCD-Dual detector. The search is carried out for pixels around the direct-beam position (0, 0) determined by equation (1)

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 3| May 2014| Pages 600-612

https://doi.org/10.1107/S1600577514003439

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