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Figure 9
(a) Distribution of the number of diffraction patterns, the electron density maps from which are successfully retrieved by ZOCHO, plotted with respect to the Csym scores and diffraction intensity in the small-angle region. (b) Comparison of the size distribution of copper oxide particles in SEM and CXDI (white and red colored histogram bars, respectively). The inset shows assemblies of copper oxide particles in SEM and phase-retrieved electron density maps (labeled as CXDI) from diffraction patterns. The scale bar indicates 300 nm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 3| May 2014| Pages 600-612
https://doi.org/10.1107/S1600577514003439
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