Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on multilayer samples

Li, W.-B.; Yang, X.-Y.; Zhu, J.-T.; Tu, Y.-C.; Mu, B.-Z.; Yu, H.-S.; Wei, X.-J.; Huang, Y.-Y.; Wang, Z.-S.

doi:10.1107/S1600577514001970

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 1
Schematic of the experimental set-up for the fluorescence EXAFS measurement. The angles of θ and φ represent the incident X-ray beam and the detected X-ray fluorescence photon direction with respect to the sample surface, respectively.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 3| May 2014| Pages 561-567

https://doi.org/10.1107/S1600577514001970

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