Macromolecular crystallography beamline X25 at the NSLS

Héroux, A.; Allaire, M.; Buono, R.; Cowan, M.L.; Dvorak, J.; Flaks, L.; LaMarra, S.; Myers, S.F.; Orville, A.M.; Robinson, H.H.; Roessler, C.G.; Schneider, D.K.; Shea-McCarthy, G.; Skinner, J.M.; Skinner, M.; Soares, A.S.; Sweet, R.M.; Berman, L.E.

doi:10.1107/S1600577514003415

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Figure 3
Two different methods of controlling the divergence of the beam. The measurements were performed at 10.057 keV with the four-bounce analyzer. (a) The front-end apertures were kept fixed at 2.9 mm and the sagittal focus on the second crystal was varied. The linear correlation of the merit (normalized counts for the ionization chamber) enables a quick assessment of the divergence. (b) Sagittal focus fixed at its optimal value for the energy used and the FEA were varied. (c) Diagram of the four-bounce analyzer apparatus.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 3| May 2014| Pages 627-632

https://doi.org/10.1107/S1600577514003415

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