addenda and errata\(\def\hfill{\hskip 5em}\def\hfil{\hskip 3em}\def\eqno#1{\hfil {#1}}\)

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ISSN: 1600-5775

Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling. Erratum

aModern Magnetic Systems, Max Planck Institute for Intelligent Systems, Heisenbergstrasse 3, D-70569 Stuttgart, Germany, bInstitut Für Angewandte Physik, Friedrich-Schiller-Universität Jena, Albert-Einstein-Strasse 15, D-07745 Jena, Germany, cCIC nanoGUNE Consolider, Tolosa Hiribidea 76, E-20018 Donostia-San Sebastian, Spain, dIkerbasque, Basque Foundation for Science, Alameda Urquijo 36-5, E-48011 Bilbao, Spain, and eEuropean Synchrotron Radiation Facility, 6 Rue Jules Horowitz, F-38043 Grenoble, France
*Correspondence e-mail: grevent@is.mpg.de

(Received 10 March 2014; accepted 26 March 2014; online 24 April 2014)

Corrections to the article by Mayer et al. [J. Synchrotron Rad. (2013), 20, 433–440] are given.

In the paper by Mayer et al. (2013[Mayer, M., Keskinbora, K., Grévent, C., Szeghalmi, A., Knez, M., Weigand, M., Snigirev, A., Snigireva, I. & Schütz, G. (2013). J. Synchrotron Rad. 20, 433-440.]), the two following errors are corrected:

On page 434, first column, line 17, it should read: `…and sub-10 nm (Ruhlandt et al., 2012[Ruhlandt, A., Liese, T., Radisch, V., Kruger, S. P., Osterhoff, M., Giewekemeyer, K., Krebs, H. U. & Salditt, T. (2012). AIP Adv. 2, 012175.]) using single MLLs'.

On page 437, second column, line 16, the effect of `apodization' on the position of the first minimum of the Airy disk was erroneous. It should read: `…, to approximately 29.88 nm instead of 42.7 nm'. The error comes from a typo in the equation utilized to calculate this effect.

The authors apologize for these mistakes and for any inconvenience they might have caused.

References

First citationMayer, M., Keskinbora, K., Grévent, C., Szeghalmi, A., Knez, M., Weigand, M., Snigirev, A., Snigireva, I. & Schütz, G. (2013). J. Synchrotron Rad. 20, 433–440.  Web of Science CrossRef CAS IUCr Journals Google Scholar
First citationRuhlandt, A., Liese, T., Radisch, V., Kruger, S. P., Osterhoff, M., Giewekemeyer, K., Krebs, H. U. & Salditt, T. (2012). AIP Adv. 2, 012175.  Google Scholar

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Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
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