view article
Figure 6
Beam at the sample position using a 20 µm-thick Ce:YAG fluorescence screen. (a) Focused beam. (b) Vertically defocused beam showing weak stripes. The vertical beam profile is compared with a ray-tracing simulation (including the resolution of the imaging system). (c) Beam defocused in the horizontal and the vertical dimensions to 610 µm × 305 µm FWHM (H × V).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 4| May 2014| Pages 679-689
doi:10.1107/S160057751400825X
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS