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Figure 7
Residual profiles of the VFM in bent working conditions as measured by the ALBA-NOM (continuous line), and as measured in situ using the pencil-beam technique using X-ray beam (dashed line).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 4| May 2014| Pages 679-689
doi:10.1107/S160057751400825X
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