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Figure 1
Detection of Auger electrons using the GMSD under ambient conditions after irradiating the sample with a direct X-ray beam, where E is the energy of the electrons escaping from the sample surface and/or bulk into the ambient gaseous environment. The electron escape energy is a function of the depth at which these have been generated. The larger the depth, the more loss events will take place. The sample bias is set to a high negative potential which creates the drift field accelerating the electrons towards the GMSD. The emergent electron energy profile (as shown in Fig. 2[link]) contains information about the structure as a function of depth from the surface.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 4| May 2014| Pages 744-750
doi:10.1107/S1600577514008108
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