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Figure 2
Instrumentation for X-ray imaging. (a) Schematic of ZP-focused microscopes for scanning transmission X-ray microscopy (STXM) and scanning photoelectron microscopy (SPEM). (b) Set up for nano-X-ray absorption at the Swiss Light Source (Schmid et al., 2010BB58) using a scanning probe tip to localize signal below the X-ray spot size. (c) Details of the interaction region of the tip, sample and X-rays (Schmid et al., 2010BB58). [Sources: (a) adapted from J. Stöhr, used with permission; (b, c) from Schmid et al. (2010BB58), used with permission from Ultramicroscopy via RightsLink license 3398911389610.]

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 5| August 2014| Pages 1019-1030
doi:10.1107/S1600577514013046
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