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Figure 6
(Top image stack) Multi-threshold measurement of two-color diffraction was simulated by summing the 13.5 keV and 15 keV diffraction image stacks at eight different pairs of matching detector comparator voltage thresholds. (Middle plots) The three parameters previously recovered for each color (Fig. 3[link]) were used to re-separate the number of counts contributed by each of the two colors, demonstrated here for a single pixel. Comparison against the original monochromatic dataset shows good agreement. (Bottom images) The fit was repeated for all pixels and shown in the top row of images. Comparison against the original monochromatic dataset qualitatively shows good agreement.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 5| August 2014| Pages 1180-1187
doi:10.1107/S1600577514014167
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