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Figure 7
Reflectivity scans of two multilayer mirrors with 100 pairs of W/C, a multilayer period of 2.8 nm and a thickness ratio of 1/3 (solid line) and 1/2 (dashed line), measured with Mo radiation (17.4 keV) at the X-ray reflectometer at Helmholtz Zentrum Geesthacht.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 5| August 2014| Pages 968-975
doi:10.1107/S1600577514016221
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