Figure 1
Schematic of a typical ptychography set-up. The X-ray beam generated by the insertion device is filtered spectrally with a monochromator, admitted through one or multiple beam-defining apertures, which act as a coherence filter as well, and focused on the sample. For each position of the sample in the beam, i.e. lateral displacement and rotation, the intensity of the scattered X-ray wave is measured in the far-field using a pixel array detector. |