Figure 1
ARPES schematic. Incident photons excite a distribution of photoelectrons at the sample. The photoelectrons in a plane are dispersed in energy and angle by a combination of an electron lens coupled to a hemispherical capacitor. Electrons with a range of energy and angles are directly imaged onto a two-dimensional multi-channel detector. A sample goniometer allows for the XYZ and angular positioning of the sample with respect to the detector and incident photon beam. [Reproduced from Rotenberg (2010).] |