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Figure 3
Detection scheme for nanoARPES. The photon source (typically the exit slit of a monochromator) illuminates a Fresnel zone plate (ZP), which is imaged onto the sample. Reduction of stray diffraction orders requires an order-sorting aperture (OSA) which is here schematically shown as a cone. The application of photons to the sample induces a photoelectron cloud, a portion of which (the e− fan-out cone) is collected by an electron lens coupled to an electron hemispherical analyzer (not shown). [Reproduced from Rotenberg (2010BB33).]

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 5| August 2014| Pages 1048-1056
doi:10.1107/S1600577514015409
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