A new detector for sub-millisecond EXAFS spectroscopy at the European Synchrotron Radiation Facility

Kantor, I.; Labiche, J.-C.; Collet, E.; Siron, L.; Thevenin, J.-J.; Ponchut, C.; Borrel, J.; Mairs, T.; Marini, C.; Strohm, C.; Mathon, O.; Pascarelli, S.

doi:10.1107/S1600577514014805

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Figure 1
The optical scheme of the energy-dispersive XAS spectrometer. On beamline ID24 the source is a demagnified image of the undulator source (i.e. secondary source). Source-to-crystal distance (p) is equal to 22 or 31 m (depending on the chosen beamline branch), q = 0.6–1.2 m and d = 1.2–2.4 m.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 6| November 2014| Pages 1240-1246

doi:10.1107/S1600577514014805

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