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Figure 4
Flat-field correction of an XRIM image. (a) Raw image of crystallographic steps on the (001) surface of a KAlSi3O8 single crystal acquired at Q ≃ 0.5 Å−1. The scale bar is 2.5 µm. (b) Flat-field-corrected image. In both images the vertical (red) line marks the location of the line profiles. The contrast is defined by C = (Istep-Ib)/Ib, where Ib is the background intensity and Istep is the intensity at the step (dip). These values are determined by fitting a Gaussian function plus a linear background to the profiles. A contrast of −0.18 ± 0.01 is found in (a) and −0.17 ± 0.03 in (b).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 6| October 2014| Pages 1252-1261
doi:10.1107/S1600577514016555
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