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![[Figure 1]](ig5011fig1mag.jpg)
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Figure 1
Data-collection strategy. The X-ray beam was used to scan for crystals using standard grid-scan techniques. When crystals were found, a 6° wedge of data was obtained (either a single 6° rotation or three 2° rotations). Serial data were obtained from crystals deposited on micro-meshes (a), on in situ micro-plates (b) and on a moving conveyor belt system (c) (Roessler et al., 2013  ). In each case, diffraction from ∼100 individual crystals was collated into a high-quality data set. Data analysis was aided by triaging software. Initially, all data were obtained with the X-ray beam normal to the flat surface of the media on which crystals were deposited. Additional data were obtained with the X-ray beam tilted 30–60° relative to the flat crystal-containing surface (the additional data were needed because preferential orientation of the crystallographic c axis limited the maximum obtainable completeness using this strategy to ∼70%, as described in §3.2). |
![[Figure 1]](ig5011fig1.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
