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Figure 1
(a) Photograph of the combined XRD/XRF experiment on a continuous composition spread thin film library. (b) Illustration of the scattering geometry showing the important parameters for the material library plate (photograph of continuous composition spread thin film) and detector (example diffraction image). The geometry parameters for a particular scattered beam are also shown. A Cartesian coordinate system is noted and for each angle the parenthesis label denotes whether the angle lies in the scattering plane or a Cartesian axis plane. The angles Ψ and β do not lie in any of these planes.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 6| October 2014| Pages 1262-1268
doi:10.1107/S1600577514016488
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