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Figure 12
Diffraction pattern sequence captured with the ICCD which shows the evolution of the martensitic transformation at sequential stress states during the dynamic loading process. It is important to note that each pattern is captured from a different sample within the tensile loading history at stress–strain states represented by the appropriate symbols in Fig. 9[link] and at delay times shown in Fig. 11[link]. The pattern taken at t = 1.75 ms was captured within the PCI image sequence shown in Fig. 10[link].

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 1| January 2015| Pages 49-58
https://doi.org/10.1107/S1600577514022747
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