In situ synchrotron X-ray diffraction analysis of deformation behaviour in Ti–Ni-based thin films

Wang, H.; Sun, G.; Wang, X.; Chen, B.; Zu, X.; Liu, Y.; Li, L.; Pan, G.; Sheng, L.; Liu, Y.; Fu, Y.Q.

doi:10.1107/S1600577514021031

Journal of Synchrotron Radiation Journal of
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Figure 10
S-XRD results of 750°C annealed Ti–Ni–Cu7.5 film for (a) 0° azimuth angle and (b) 90° azimuth angle at different loading states (at RT).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 1| January 2015| Pages 34-41

https://doi.org/10.1107/S1600577514021031

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