In situ synchrotron X-ray diffraction analysis of deformation behaviour in Ti–Ni-based thin films

Wang, H.; Sun, G.; Wang, X.; Chen, B.; Zu, X.; Liu, Y.; Li, L.; Pan, G.; Sheng, L.; Liu, Y.; Fu, Y.Q.

doi:10.1107/S1600577514021031

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 3
Bright-field micrograph of as-deposited Ti–Ni film revealing that the monoclinic martensite plates are 〈011〉 type-II twins. Selected area diffraction patterns with incident electron beam along [101]_M ∥ [−110]_T.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 1| January 2015| Pages 34-41

https://doi.org/10.1107/S1600577514021031

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page