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Figure 6
Room-temperature S-XRD results of Ti–Ni (a), Ti–Ni–Cu3.5 (b) and Ti–Ni–Cu7.5 (c) films post-annealed at 650°C and 750°C.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 1| January 2015| Pages 34-41
https://doi.org/10.1107/S1600577514021031
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