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Figure 7
S-XRD results of 750°C annealed Ti–Ni film for (a) 0° azimuth angle and (b) 90° azimuth angle at different loading stages (at RT).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 1| January 2015| Pages 34-41
https://doi.org/10.1107/S1600577514021031
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