X-ray diffraction strain analysis of a single axial InAs1–xPx nanowire segment

Keplinger, M.; Mandl, B.; Kriegner, D.; Holý, V.; Samuelsson, L.; Bauer, G.; Deppert, K.; Stangl, J.

doi:10.1107/S160057751402284X

Figure 2
(a) Reciprocal-space map of the symmetric HRXRD measurement around the (111) InAs/InAs_1–xP_x Bragg reflections. The InP Bragg reflection is denoted with a white circle. Furthermore, two slices are shown in the graph on the right-hand side at the Q_z positions of the dashed lines indicated in the reciprocal-space map. The green line is positioned at the nominal position of the (111) InAs zinc-blende Bragg reflection, and the cyan line at the (111) and its hexagonal equivalent (000.2) InAs WZ/ZB Bragg reflections, with 70% WZ and 30% ZB. The position as well as the FWHM of a Gauss distribution fitted to the WZ/ZB Bragg reflection are shown as a blue error bar in the right-hand graph. (b) Reciprocal-space map of the asymmetric HRXRD measurement. The contour plot shows the intensity distribution around the ( $[10\bar{1}.5]$ ) InAs/InAs_1–xP_x Bragg reflections, and the dashed white line indicates the position of the cut shown beside; the blue line represents the measured intensity, the green line the simulation. (c) The Gamma distribution function which describes the distribution of the WZ segment lengths (L) in the investigated NWs determined by the simulation shown in (b).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 1| January 2015| Pages 59-66

https://doi.org/10.1107/S160057751402284X

Open

access

Search IUCr Journals		doi		Advanced search
Author		volume	page