Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X-ray diffraction

Köhl, M.; Schroth, P.; Minkevich, A.A.; Hornung, J.-W.; Dimakis, E.; Somaschini, C.; Geelhaar, L.; Aschenbrenner, T.; Lazarev, S.; Grigoriev, D.; Pietsch, U.; Baumbach, T.

doi:10.1107/S1600577514023480

Journal of Synchrotron Radiation Journal of
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Figure 4
Comparison of the cumulative q_z intensity profiles of sample S1 (blue) and S2 (red). Dotted lines correspond to the signal of the crystallites of the respective sample, continuous lines to the wire signal and dashed lines to the overall signal of all observed frames.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 1| January 2015| Pages 67-75

https://doi.org/10.1107/S1600577514023480

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