Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X-ray diffraction

Köhl, M.; Schroth, P.; Minkevich, A.A.; Hornung, J.-W.; Dimakis, E.; Somaschini, C.; Geelhaar, L.; Aschenbrenner, T.; Lazarev, S.; Grigoriev, D.; Pietsch, U.; Baumbach, T.

doi:10.1107/S1600577514023480

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 6
q_z intensity profiles of the five frames suited best for determining the ratio of the interplanar spacing of wurtzite and zinc blende structures (see Fig. 3

). The dashed vertical lines correspond to s = 16.2% which, in turn, corresponds to (d_WZ/d_ZB) = 1 + 0.66%.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 1| January 2015| Pages 67-75

https://doi.org/10.1107/S1600577514023480

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page