view article
Figure 10
When installed on the I22 beamline in a vertical focusing geometry, the next-generation bimorph mirror produced a much smaller and better defined reflected X-ray beam (upper right-hand image) compared with using the first-generation bimorph mirror suffering from the junction effect (upper left-hand image). The lower chart shows the normalized intensity cross-sectional profile through both X-ray beams in the vertical direction.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 1| January 2015| Pages 10-15
https://doi.org/10.1107/S1600577514020025
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS