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Figure 8
Piezo response functions (PRF) showing how each piezo responds to an applied voltage, as measured using ex situ (Diamond-NOM, upper panel) and in situ (X-ray, lower panel) methods. Small differences in amplitude can likely be attributed to the different orientation of the mirror in each test.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 1| January 2015| Pages 10-15
https://doi.org/10.1107/S1600577514020025
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