Comparative study of the X-ray reflectivity and in-depth profile of a-C, B4C and Ni coatings at 0.1–2 keV

Kozhevnikov, I.V.; Filatova, E.O.; Sokolov, A.A.; Konashuk, A.S.; Siewert, F.; Störmer, M.; Gaudin, J.; Keitel, B.; Samoylova, L.; Sinn, H.

doi:10.1107/S1600577515000430

Journal of Synchrotron Radiation Journal of
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Figure 3
Depth-distribution of the concentration of the chemical elements in the C-coated mirror found in frames of the tri-layer model (a) and after numerical refinement (b). The z-axis is directed into the substrate.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 2| February 2015| Pages 348-353

doi:10.1107/S1600577515000430

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