view article
Figure 4
(a) SEM image of a test pattern used during synchrotron experiments. (b) Fluorescence image, (c) DPC image. Panels (d)–(f) show the same SEM, fluorescence and DPC images with red dots representing contours of the test pattern and directly superimposed on top of these images. (g) Drift during measurements derived from direct comparison between SEM and fluorescence images; squares represent the x-direction and circles the y-direction.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 2| January 2015| Pages 336-341
doi:10.1107/S1600577514025715
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS