Validation of a Geant4 model of the X-ray fluorescence microprobe at the Australian Synchrotron

Dimmock, M.R.; de Jonge, M.D.; Howard, D.L.; James, S.A.; Kirkham, R.; Paganin, D.M.; Paterson, D.J.; Ruben, G.; Ryan, C.G.; Brown, J.M.C.

doi:10.1107/S1600577515000223

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Figure 2
(a) XFM beam intensity profile at the focal plane, z = 51.6 mm. Overlaid on the distribution is an elliptical Gaussian fit. (b) A plot of Gaussian widths, $[\omega(z)]$ , from profile fits as a function of scintillation detector offset along the z-axis. The filled circles and triangles are the experimentally measured widths for the horizontal and vertical beam components, respectively. The dashed lines are the diffraction-limited distributions [equation (5)

]. The solid lines show the fits after the blurring term, $[\omega^{\rm{blur}}(z)]$ , is included.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 2| February 2015| Pages 354-365

doi:10.1107/S1600577515000223

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