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Figure 3
(a) and (b) show the x and y profiles of a sub-section of an image acquired by scanning an Xradia X50-30-1CR test pattern. The profiles are taken from the scan image of the Ni fluorescence content of the phantom collected with E0 = 18.5 keV. Gaussian fits (black) are overlaid on the experimental data (blue). |


journal menu![[Figure 3]](mo5104fig3.jpg)



