view article

Figure 3
(a) and (b) show the x and y profiles of a sub-section of an image acquired by scanning an Xradia X50-30-1CR test pattern. The profiles are taken from the scan image of the Ni fluorescence content of the phantom collected with E0 = 18.5 keV. Gaussian fits (black) are overlaid on the experimental data (blue).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds