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Figure 1
Measurement of the scattering spectra from a SiO2 sample with an energy resolution of about 1 eV. The indicated scattering angles were in the vertical direction, and the X-ray polarization was not a factor.

Journal logoJOURNAL OF
ISSN: 1600-5775
Volume 22| Part 2| March 2015| Pages 436-445
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