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Figure 1
SEM pictures taken at an acceleration voltage of 2 keV of (a) sample A with a thickness of 22 µm and (b) sample B with a thickness of 10 µm for the left and 15 µm for the right part. The area surrounded by the blue box is thought to be the result of FIB damage and was therefore not investigated with scanning X-ray diffraction.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 2| February 2015| Pages 267-272
doi:10.1107/S1600577515001241
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