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Figure 2
(a)–(d) Evolution of the optimization of the FEL emission process, as monitored on a YAG screen placed along PADReS (YAGSafety-Hutch, ∼54 m from the source). The mode quality is clearly increasing from left to right, following a proper tuning of the machine. (e) Non-optimal mode emission presenting a side structure that is recorded also in the focal spot, as shown in (f) where the indentation caused by the focus on a Si sample is reported.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 3| May 2015| Pages 565-570
https://doi.org/10.1107/S1600577515004580
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