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Figure 12
αf/αc (αc = 0.22° for Ge) curves collected after growth at 740 K. The peak integration was performed using another ROI having the size of 20 (H) × 20 (V) pixels, corresponding to a detector acceptance of 1.7 mrad in both directions centered at the pixel position of the Ge substrate Yoneda peak αc. The X-ray diffraction patterns as a function of the exit angle are collected in a way that the diffracted signal is always hitting the same detector pixel position.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 3| May 2015| Pages 688-700
https://doi.org/10.1107/S1600577515001605
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