The In situ growth of Nanostructures on Surfaces (INS) endstation of the ESRF BM32 beamline: a combined UHV–CVD and MBE reactor for in situ X-ray scattering investigations of growing nanoparticles and semiconductor nanowires

Cantelli, V.; Geaymond, O.; Ulrich, O.; Zhou, T.; Blanc, N.; Renaud, G.

doi:10.1107/S1600577515001605

Journal of Synchrotron Radiation Journal of
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Figure 14
GIXD (α_i = 0.16°), during growth at 790 K. 5 ML Au, exposure to 0.6 sccm Si₂H₆ for 120 min. (a) Radial scan along the $[[\bar211]]$ direction. (b) ω rocking curves around the Si $[(\bar422)]$ Bragg peak.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 3| May 2015| Pages 688-700

https://doi.org/10.1107/S1600577515001605

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