The In situ growth of Nanostructures on Surfaces (INS) endstation of the ESRF BM32 beamline: a combined UHV–CVD and MBE reactor for in situ X-ray scattering investigations of growing nanoparticles and semiconductor nanowires

Cantelli, V.; Geaymond, O.; Ulrich, O.; Zhou, T.; Blanc, N.; Renaud, G.

doi:10.1107/S1600577515001605

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 16
GIXD (α_i = 0.08°), during growth at 770 K. 1.75 ML Au, exposure to 0.15 sccm Si₂H₆ for 180 min. (a) ω rocking curves around the Si( $[\bar422]$ ) Bragg peak. (b) Radial scan along the $[[\bar111]]$ direction.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 3| May 2015| Pages 688-700

https://doi.org/10.1107/S1600577515001605

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page