The In situ growth of Nanostructures on Surfaces (INS) endstation of the ESRF BM32 beamline: a combined UHV–CVD and MBE reactor for in situ X-ray scattering investigations of growing nanoparticles and semiconductor nanowires

Cantelli, V.; Geaymond, O.; Ulrich, O.; Zhou, T.; Blanc, N.; Renaud, G.

doi:10.1107/S1600577515001605

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 4
Sketch of the slit system for GISAXS measurements on the INS/BM32 set-up. The incident beam is depicted by a green line coming from the right. Slits, anti-scattering slits, knife-edge and beam-stop are pictured in blue. The small-angle X-ray scattering is symbolized by red arrows.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 3| May 2015| Pages 688-700

https://doi.org/10.1107/S1600577515001605

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